Bliley Technologies, Inc.

Quartz Crystal Production - X-Ray

Once the individual wafers have been fabricated from the slicing operation, they must be checked for their accuracy to the required operation characteristics. For quartz resonators, this means the angle tolerance from the ideal slicing angle that results in the frequency-temperature characteristic of the crystal resonator. The method to determine this angle is Bragg X-ray diffraction. A highly collimated X-ray beam is reflected off the wafer under test and is measured against a known standard geometric position. The measurement requires high precision where angle tolerances determined within +/- 10 seconds of arc.
 Crystal Production
 Engineering & Design
 Oscillator Production

OCXO | TCXO | VCXO | XO | Technical Resources | Company Profile | Sales & Support |
Plant Tour | Contact | Custom Quotes | Home

© Bliley Technologies, Inc

 

Click here to receive our free e-newsletter.

Search Bliley.com sitemap